TY  - GEN
AU  - Brian Weiss
AU  - Michael Brundage
AU  - Yannick Tamm
AU  - Tommi Makila
AU  - Joan Pellegrino
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-04-24
DO  - https://doi.org/10.6028/NIST.AMS.100-23
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - Summary Report on the Industry Forum for Monitoring, Diagnostics, and Prognostics for Manufacturing Operations
ER  -