TY  - CHAP
AU  - John Slotwinski
AU  - Thomas Campbell
C2  - Focus on Metrology Research, NOVA Science Publishers, Hauppauge, NY
DA  - 2013-07-01
LA  - en
M1  - 7
PB  - Focus on Metrology Research, NOVA Science Publishers, Hauppauge, NY
PY  - 2013
TI  - Metrology for Additive Manufacturing - Opportunities in a Rapidly Emerging Technology
ER  -