TY  - CONF
AU  - Kin Cheung
C2  - 2018 IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA
DA  - 2018-05-03
DO  - https://doi.org/10.1109/IRPS.2018.8353545
LA  - en
PB  - 2018 IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA
PY  - 2018
TI  - SiC power MOSFET gate oxide breakdown reliability – Current status
ER  -