TY  - JOUR
AU  - Brent Sperling
AU  - Berc Kalanyan
C2  - Applied Spectroscopy
DA  - 2018-09-01
LA  - en
M1  - 72
PB  - Applied Spectroscopy
PY  - 2018
TI  - Evaluation of silicon wafer-based internal reflection elements for use with in situ FT-IR spectroscopy
ER  -