TY  - JOUR
AU  - Zimmerman, Neil
AU  - Huber, W
AU  - Fujiwara, Akira
AU  - Takahashi, Yasuo
C2  - Applied Physics Letters
DA  - 2001-11-05
DO  - https://doi.org/10.1063/1.1415776
LA  - en
M1  - 79
PB  - Applied Physics Letters
PY  - 2001
TI  - Excellent charge offset stability in a Si-based single-electron tunneling transistor
ER  -