TY  - JOUR
AU  - Neil Zimmerman
AU  - Mark Keller
C2  - Measurement Science and Technology
DA  - 2003-07-16
DO  - https://doi.org/10.1088/0957-0233/14/8/307
LA  - en
M1  - 14
PB  - Measurement Science and Technology
PY  - 2003
TI  - Electrical metrology with single electrons
ER  -