TY  - GEN
AU  - Felix Kim
AU  - Shawn Moylan
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2018-05-17
DO  - https://doi.org/10.6028/NIST.AMS.100-16
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2018
TI  - Literature Review of Metal Additive Manufacturing Defects
ER  -