TY  - GEN
AU  - June Lau
AU  - John Bonevich
AU  - Andrew Herzing
AU  - Ann Chiaramonti
AU  - Robert Keller
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2017-12-21
DO  - https://doi.org/10.6028/NIST.SP.1217
LA  - en
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2017
TI  - A workshop report on “Electron Microscopy Frontiers: Challenges and Opportunities”
ER  -