TY  - JOUR
AU  - Yaw Obeng
AU  - Kin Cheung
AU  - Dmitry Veksler
AU  - Christopher Sunday
C2  - Journal of Applied Physics
DA  - 2017-11-01
LA  - en
PB  - Journal of Applied Physics
PY  - 2017
TI  - Microwave Evaluation of Electromigration Susceptibility in Advanced Interconnects
ER  -