TY - GEN AU - Brian Weiss AU - Donnie Alonzo AU - Steve Weinman C2 - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD DA - 2017-11-13 DO - https://doi.org/10.6028/NIST.AMS.100-13 LA - en PB - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD PY - 2017 TI - Summary Report on a Workshop on Advanced Monitoring, Diagnostics, and Prognostics for Manufacturing Operations ER -