TY  - CONF
AU  - Liangchun Yu
AU  - Kin Cheung
AU  - Greg Dunne
AU  - Kevin Matocha
AU  - John Suehle
AU  - Kuang Sheng
C2  - Silicon Carbide and Related Materials 2009, Nuremberg, -1
DA  - 2009-10-11
LA  - en
PB  - Silicon Carbide and Related Materials 2009, Nuremberg, -1
PY  - 2009
TI  - Gate Oxide Long-Term Reliability of 4H-SiC MOS Devices
ER  -