TY  - CHAP
AU  - Nhan Nguyen
C2  - Metrology and Diagnostic Technology for Nanoelectronics, Pan Stanford Publishing, Boca Raton, FL
DA  - 2017-01-30
LA  - en
PB  - Metrology and Diagnostic Technology for Nanoelectronics, Pan Stanford Publishing, Boca Raton, FL
PY  - 2017
TI  - Band Alignment Measurement by Internal Photoemission Spectroscopy
ER  -