TY  - JOUR
AU  - Neil Zimmerman
AU  - W Huber
AU  - Brian Simonds
AU  - Emmanouel Hourdakis
AU  - Fujiwara Fujiwara
AU  - Yukinori Ono
AU  - Yasuo Takahashi
AU  - Hiroshi Inokawa
AU  - Miha Furlan
AU  - Mark Keller
C2  - Journal of Applied Physics
DA  - 2008-08-07
DO  - https://doi.org/10.1063/1.2949700
LA  - en
M1  - 104
PB  - Journal of Applied Physics
PY  - 2008
TI  - Why the long-term charge offset drift in Si single-electron tunneling transistors is much smaller (better) than in metal-based ones: Two-level fluctuator stability
ER  -