TY  - JOUR
AU  - Jeyavel Velmurugan
AU  - Amit Agrawal
AU  - Sang An
AU  - Eric Choudhary
AU  - Veronika Szalai
C2  - Analytical Chemistry
DA  - 2017-01-27
DO  - https://doi.org/10.1021/acs.analchem.7b00210
LA  - en
M1  - 89
PB  - Analytical Chemistry
PY  - 2017
TI  - Fabrication of Scanning Electrochemical Microscopy-Atomic Force Microscopy (SECM-AFM) Probes to Image Surface Topography and Reactivity at the Nanoscale
ER  -