TY  - JOUR
AU  - Thomas Michels
AU  - Vladimir Aksyuk
C2  - IEEE Photonics Technology Letters
DA  - 2017-01-27
DO  - https://doi.org/10.1109/LPT.2017.2660439
LA  - en
M1  - 29
PB  - IEEE Photonics Technology Letters
PY  - 2017
TI  - Optical probe for nondestructive wafer-scale characterization of photonic elements
ER  -