TY  - GEN
AU  - Gary Anderson
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2017-01-13
DO  - https://doi.org/10.6028/jres.122.013
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2017
TI  - Identifying NIST Impacts on Patenting: A Novel Data Set and Potential Uses
ER  -