TY  - GEN
AU  - Richard Gates
AU  - Mark McLean
AU  - William Osborn
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2015-12-02
DO  - https://doi.org/10.6028/jres.120.018
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2015
TI  - Smart Electronic Laboratory Notebooks for the NIST Research Environment
ER  -