TY  - GEN
AU  - Sylvere Krima
AU  - Thomas Hedberg
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2016-11-29
DO  - https://doi.org/10.6028/jres.121.027
LA  - en
M1  - 121
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2016
TI  - Digital Manufacturing Certificate Toolkit: Adding Trust and Traceability to Product Data
ER  -