TY  - GEN
AU  - James Randa
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2016-10-24
DO  - https://doi.org/10.6028/NIST.TN.1939
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2016
TI  - Detailed Study of Uncertainties in On-Wafer Transistor Noise-Parameter Measurements
ER  -