TY  - GEN
AU  - Yung-Tsun Lee
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2015-11-17
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2015
TI  - A Journey in Standard Development- The Core Manufacturing Simulation Data (CMSD) Information Model
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918117
ER  -