TY  - CONF
AU  - Nhan Nguyen
AU  - Oleg Kirillov
AU  - Hao Xiong
AU  - John Suehle
C2  - Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD
DA  - 2007-09-30
LA  - en
PB  - Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD
PY  - 2007
TI  - Internal Photoemission Spectroscopy of Metal Gate/High-k/ Semiconductor Interfaces
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32724
ER  -