TY  - CONF
AU  - John Suehle
C2  - GOMAC Digest of Technical Papers, Monterey, CA
DA  - 2004-03-18
LA  - en
PB  - GOMAC Digest of Technical Papers, Monterey, CA
PY  - 2004
TI  - Reliability Implications of Scaling Gate Oxides in Deep Submicron CMOS Technologies
ER  -