TY  - JOUR
AU  - John Suehle
C2  - IEEE Transactions on Electron Devices
DA  - 2002-06-01
LA  - en
M1  - 49
PB  - IEEE Transactions on Electron Devices
PY  - 2002
TI  - Ultra-Thin Gate Oxide Reliability: Physical Models, Statistics, and Characterization
ER  -