TY  - CONF
AU  - Harry Schafft
C2  - Final Report, 1990 International Wafer Level Reliability Workshop, Lake Tahoe, CA
DA  - 1991-12-31
LA  - en
PB  - Final Report, 1990 International Wafer Level Reliability Workshop, Lake Tahoe, CA
PY  - 1991
TI  - Measurement, Use, and Interpretation of TCR
ER  -