TY  - JOUR
AU  - John Kramar
C2  - Measurement Science & Technology
DA  - 2005-09-23
LA  - en
M1  - 16
PB  - Measurement Science & Technology
PY  - 2005
TI  - Nanometer Resolution Metrology with the NIST Molecular Measuring Machine
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=822533
ER  -