TY  - CHAP
AU  - Jason Campbell
AU  - P. Lenahan
C2  - Bias Temperature Instability for Devices and Circuits, Springer Science+Business Media LLC, New York, NY
DA  - 2014-01-01
LA  - en
PB  - Bias Temperature Instability for Devices and Circuits, Springer Science+Business Media LLC, New York, NY
PY  - 2014
TI  - Atomic Scale Defects Associated with the Negative Bias Temperature Instability
ER  -