TY  - CONF
AU  - Zakariae Chbili
AU  - Kin Cheung
AU  - Jason Campbell
AU  - John Suehle
AU  - D. Ioannou
AU  - Aivars Lelis
AU  - Sei-Hyung Ryu
C2  - International Integrated Reliability Workshop Final Report, Stanford Sierra Camp, CA
DA  - 2014-03-03
LA  - en
PB  - International Integrated Reliability Workshop Final Report, Stanford Sierra Camp, CA
PY  - 2014
TI  - Unusual Bias Temperature Instability in SiC DMOSFET
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914921
ER  -