TY  - JOUR
AU  - Chukwudi Okoro
AU  - Lyle Levine
AU  - Yaw Obeng
AU  - Ruqing Xu
C2  - Journal of Materials Science
DA  - 2015-06-20
LA  - en
M1  - 50
PB  - Journal of Materials Science
PY  - 2015
TI  - Experimental Measurement of the Effect of Copper Through-Silicon Via Diameter on Stress Buildup Using Synchrotron-based X-ray Source
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=917647
ER  -