TY  - JOUR
AU  - Cedric Powell
AU  - Aleksander Jablonski
AU  - W Werner
AU  - W Smekal
C2  - Applied Surface Science
DA  - 2005-04-01
LA  - en
M1  - 239
PB  - Applied Surface Science
PY  - 2005
TI  - Characterization of Thin Films on the Nanometer Scale by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ER  -