TY  - CONF
AU  - Thomas Germer
AU  - Maria Nadal
C2  - Surface Scattering and Diffraction for Advanced Metrology, Conference | | Surface Scattering and Diffraction for Advanced Metr
ology | SPIE
DA  - 2001-10-01
LA  - en
PB  - Surface Scattering and Diffraction for Advanced Metrology, Conference | | Surface Scattering and Diffraction for Advanced Metr
ology | SPIE
PY  - 2001
TI  - Modeling the Appearance of Special Effect Pigment Coatings
ER  -