TY  - CONF
AU  - Yoshihiro Ohno
AU  - B Kranicz
C2  - CIE Expert Symposium
DA  - 2001-05-01
LA  - en
PB  - CIE Expert Symposium
PY  - 2001
TI  - Spectroradiometer Characterization for Colorimetry of LEDs
ER  -