TY - GEN AU - Klaus Mielenz AU - Eric Shirley C2 - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD DA - 2006-04-01 LA - en M1 - 111 No. 1 PB - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD PY - 2006 TI - Optical Diffraction in Close Proximity to Plane Apertures. IV. Test of a Pseudo-Vectorial Theory ER -