TY  - GEN
AU  - R Gupta
AU  - Simon Kaplan
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2003-11-01
LA  - en
M1  - 108 No. 6
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2003
TI  - High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
ER  -