TY  - JOUR
AU  - Leonard Hanssen
AU  - Simon Kaplan
C2  - SPIE International Society for Optical Engineering
DA  - 1998-07-19
DO  - https://doi.org/10.1117/12.326674
LA  - en
PB  - SPIE International Society for Optical Engineering
PY  - 1998
TI  - Methods for Absolute Reflectance Measurement of Transmissive Materials in the Infrared
ER  -