TY - JOUR AU - Jan Obrzut AU - R Nozaki C2 - IEEE Transactions on Instrumentation and Measurement DA - 2002-08-01 LA - en M1 - 51 PB - IEEE Transactions on Instrumentation and Measurement PY - 2002 TI - Broadband Characterization of High-Dielectric Constant Films for Power-Ground Decoupling UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851740 ER -