TY  - CONF
AU  - Jan Obrzut
AU  - Nozaki AnopchenkoA
C2  - Instrumentation and Measurement Technolgy Conference| | | IEEE, Ottawa, CA
DA  - 2006-03-01
LA  - en
M1  - 90
PB  - Instrumentation and Measurement Technolgy Conference| | | IEEE, Ottawa, CA
PY  - 2006
TI  - Broadband Permittivity Measurements of High Dielectric Constant Films
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852509
ER  -