TY  - JOUR
AU  - F Mopsik
C2  - Review of Scientific Instruments
DA  - 2000-06-01
LA  - en
M1  - 71
PB  - Review of Scientific Instruments
PY  - 2000
TI  - Extended Frequency Range Dielectric Measurements of Thin Films
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851422
ER  -