TY  - JOUR
AU  - Andrew Slifka
AU  - John Drexler
C2  - Microscopy and Analysis
DA  - 2003-01-01
LA  - en
M1  - No. 93
PB  - Microscopy and Analysis
PY  - 2003
TI  - Apparent Mobility of Interfaces in Integral Resistor Material
ER  -