TY  - JOUR
AU  - Curt Richter
AU  - Hao Xiong
AU  - Xiaoxiao Zhu
AU  - Wenyong Wang
AU  - Vincent Stanford
AU  - Woong-Ki Hong
AU  - Takhee Lee
AU  - D. Ioannou
AU  - Qiliang Li
C2  - IEEE Transactions on Electron Devices
DA  - 2008-11-01
LA  - en
M1  - 55
PB  - IEEE Transactions on Electron Devices
PY  - 2008
TI  - Metrology for the Electrical Characterization of Semiconductor Nanowires
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33073
ER  -