TY - GEN
AU - Kim, Y
AU - Rudd, M
C2 - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA - 1997-01-01
LA - en
M1 - 102
PB - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY - 1997
TI - Electron-Impact Total Ionization Cross Sections of CH AND C2H2
ER -