TY  - JOUR
AU  - Stan, Gheorghe
C2  - Journal of Applied Physics
DA  - 2023-07-11 04:07:00
DO  - https://doi.org/10.1063/5.0160540
LA  - en
PB  - Journal of Applied Physics
PY  - 2023
TI  - Dielectric constant measurement sensitivity in electrostatic force and force gradient microscopy-based modes
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956141
ER  -