TY  - CONF
AU  - Voigt, Cooper
AU  - Moxim, Stephen
AU  - Campbell, Jason
AU  - Akturk, Akin
AU  - Ryan, Jason
C2  - 2025 IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, US
DA  - 2026-04-28 04:04:00
LA  - en
PB  - 2025 IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, US
PY  - 2026
TI  - Defects involved in TDDB-stressed SiC MOSFET
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=960620
ER  -