TY  - JOUR
AU  - Muramoto, Shinichiro
AU  - Verkouteren, Robert
AU  - Pearce, Adam
AU  - Fitzgerald, Ryan
AU  - Bergeron, Denis
C2  - Surface and Interface Analysis
DA  - 2026-07-10 04:07:00
DO  - https://doi.org/10.1002/sia.70101
LA  - en
PB  - Surface and Interface Analysis
PY  - 2026
TI  - ToF-SIMS Single Beam Depth Profiling and Ion Beam-Induced Hydrophobic Patterning of a Novel Nanoporous Gold Absorber for Decay Energy Spectroscopy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961621
ER  -