TY  - CONF
AU  - Hendricks, Jay
AU  - Goldstein, Barbara
AU  - Artusio-Glimpse, Alexandra
AU  - Holloway, Christopher
AU  - SIMONS, MATTHEW
AU  - Prajapati, Nikunjkumar
AU  - Rotunno, Andrew
AU  - Berweger, Samuel
AU  - Campbell, Kaleb
AU  - Jayaseelan, Maitreyi
AU  - Klimov, Nikolai
AU  - Ahmed, Zeeshan
AU  - Barker, Daniel
AU  - Eckel, Stephen
AU  - Fedchak, James
AU  - Ricker, Jacob
AU  - Douglass, Kevin
AU  - Herman, Tobias
AU  - Chojnacky, Michal
AU  - Scherschligt, Julia
AU  - Schlamminger, Stephan
AU  - Chao, Leon
AU  - Comden, Zane
AU  - Draganov, John-Edward
AU  - Bui, Thinh
C2  - SMSI 2023 Conference Proceedings, Nuremburg, DE
DA  - 2023-05-08 04:05:00
DO  - https://doi.org/10.5162/SMSI2023/C1.1
LA  - en
PB  - SMSI 2023 Conference Proceedings, Nuremburg, DE
PY  - 2023
TI  - One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936744
ER  -