TY  - JOUR
AU  - Pintar, Adam
AU  - Madison, Andrew
AU  - Copeland, Craig
AU  - Farkas, Natalia
AU  - Stavis, Samuel
C2  - ACS Nano
DA  - 2026-08-06 04:08:00
LA  - en
PB  - ACS Nano
PY  - 2026
TI  - Measurement Error Models Enable Accurate Correlation of Nanoscale Properties and Structures
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956400
ER  -