TY  - CONF
AU  - Debay, Ann
AU  - Caplins, Benjamin
AU  - DeRocher, Karen
AU  - Garcia, Jacob
AU  - Martin, May
AU  - McLean, Mark
AU  - Mead, Christopher
AU  - Avila, Luis Miaja
AU  - Osborn, William
AU  - Ren, Xiaochen
AU  - Sanford, Norman
C2  - Microscopy and Microanalysis , Milwaukee, WI, US
DA  - 2026-07-27 04:07:00
DO  - https://doi.org/10.1093/mam/ozag053.061
LA  - en
M1  - 32
PB  - Microscopy and Microanalysis , Milwaukee, WI, US
PY  - 2026
TI  - Wavelength-Dependent Field Ion Emission in Atom Probe Tomography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961599
ER  -