TY  - JOUR
AU  - Cacoilo, Nuno
AU  - Yoon, Juyoung
AU  - Madhavan, Advait
AU  - McClelland, Jabez
AU  - Kanai, Shun
AU  - Fukami, Shunsuke
AU  - Borders, William
C2  - IEEE Electron Device Letters
DA  - 2026-05-26 04:05:00
DO  - https://doi.org/10.1109/LED.2026.3696800
LA  - en
M1  - 47
PB  - IEEE Electron Device Letters
PY  - 2026
TI  - 130-nm CMOS-Integrated Superparamagnetic Tunnel Junction-Based p-bit
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=960996
ER  -