TY  - GEN
AU  - Wu, John
AU  - Kim, Felix
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2026-06-22 04:06:00
DO  - https://doi.org/10.6028/NIST.AMS.100-81 
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2026
TI  - Literature Review of Fabricated Artifacts for X-ray Computed Tomography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=962022
ER  -