TY  - CONF
AU  - Hao Xiong
AU  - Dawei Heh
AU  - Shuo Yang
AU  - Moshe Gurfinkel
AU  - Gennadi Bersuker
AU  - D. Ioannou
AU  - Curt Richter
AU  - Kin Cheung
AU  - John Suehle
C2  - IEEE International Reliability Physics Symposium Proceedings, Phoenix, AZ
DA  - 2008-04-30
LA  - en
PB  - IEEE International Reliability Physics Symposium Proceedings, Phoenix, AZ
PY  - 2008
TI  - STRESS-INDUCED DEFECT GENERATION IN HFO2/SIO2 STACKS OBSERVED BY USING CHARGE PUMPING AND LOW FREQUENCY NOISE MEASUREMENTS
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32962
ER  -