TY  - JOUR
AU  - Shrestha, Pragya
AU  - Campbell, Jason
AU  - Chen, Jhih-Wei
AU  - Chang, Mau-Chung Frank
C2  - IEEE Electron Device Letters
DA  - 2026-03-31 04:03:00
DO  - https://doi.org/10.1109/LED.2026.3679453
LA  - en
M1  - 47
PB  - IEEE Electron Device Letters
PY  - 2026
TI  - Impact of Measurement Setup on Cryogenic CMOS FET Characterization
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961170
ER  -